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| Datasheet | Image | Part Number | Manufacturers | Stock | Quantity | Description |
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CD40117BPWG4 | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 18BIT 56SSOP |
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MC1019P | Rochester Electronics, LLC | 5000 |
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CD40117BPWR | Texas Instruments | 5000 |
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SN74ABT18640DLRG4 | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 18BIT 56SSOP |
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9304FM | Rochester Electronics, LLC | 5000 |
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LOGIC CIRCUIT |
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CD40117BPWRE4 | Texas Instruments | 5000 |
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SN74ABT8543DLR | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 28-SSOP |
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LOGIC CIRCUIT |
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CD40117BPWRG4 | Texas Instruments | 5000 |
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SN74ABT8543DWR | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 28-SOIC |
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MC100EP16TDTG | onsemi | 5000 |
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IC RCVR/DRVR ECL DIFF 5V 8TSSOP |
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CD4089BPWG4 | Texas Instruments | 5000 |
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IC BINARY RATE MULTIPLR 16-TSSOP |
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SN74ABT8543DWRE4 | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 28-SOIC |
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JM38510/31202B2A | Rochester Electronics, LLC | 5000 |
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ADDER/SUBTRACTOR, LS SERIES |
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CD74ACT283M96G4 | Texas Instruments | 5000 |
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IC 4BIT BINARY FILL ADDER 16SOIC |
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SN74ABT8646DWR | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 28-SOIC |
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54F385DM | Rochester Electronics, LLC | 5000 |
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ADDER/SUBTRACTOR |
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SN74ABT8543DWRG4 | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8646DWRE4 | Texas Instruments | 5000 |
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IC SCAN TEST DEVICE 28-SOIC |
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